~~NOTOC~~
======  Minute of meeting on 2018.06.20 ======

===== 1.  Attendees  =====

-- Alberto Moreno (Tesat Spacecom, Airbus DS) \\
-- Andres Perez-Celis (BYU) \\
-- Austin Lesea (Consultant, Xilinx technology expert) \\
-- Drew Boudreau (Trident Systems) \\
-- Eliot Glaser (Northrop Grumman) \\
-- Gary Swift (meeting moderator, Swift ERS) \\
-- Jeff George (The Aerospace Corporation) \\
-- Jim Devereaux (Xilinx FAE) \\
-- Joseph (Joe) Marshall (BAE) \\
-- Kevin Wray (Boeing) \\
-- Luis Berrojo (TAS-E, Thales-Alenia Space, España) \\
-- Munir Shoga (The Radiation Group,) \\
-- Nate Gazdik (Xilinx FAE) \\
-- Sebastian Garcia (Slabs) \\
-- Stephen Thomas (Boeing) \\
-- Steve Pearl (General Dynamics) \\
-- Ted Ennis (Xilinx FAE) \\
-- Victor Liau (Hughes Network Systems) \\

===== 2.  Topics covered =====

//NOTE: The following are very brief descriptions. Being this a Wiki, please complete/expand/correct them if you think we are missing interesting information (especially regarding anything important for future reference). 
//
//Paragraphs below are comments made by Gary (unless otherwise indicated).//


Reminder of the CfP for the XRTC annual meeting.

Special presentations coming next weeks: Gary on DUT thinning and LET, and a presentation from Munir.

ZU+ latchup suppression experiment ongoing. Parts are cooling down right now, after neutron irradiation. 
 
US-generation infrastructure is still in development.

V7 2017 analysis team: new insights on "where things are" on the silicon die; a summary of this will be provided, soon.

Luis asks and Gary summarizes about discriminating between dynamic upsets on user flops and upsets on CRAM, during beam testing. Luis is seeing a strange error signature. 





